2606B Series SMU
The 2606B High Density System SourceMeter (SMU) Instrument offers four 20-watt SMU channels in a 1U high form factor chassis. As manufacturers need to optimize plant floor space and reduce test time and costs, the 2606B improves density by 3 times, increases throughput, and minimizes the need to add additional racks of test equipment. This SMU is the perfect solution for production testing of Laser Diodes, LEDs, 2- and 3-terminal semiconductors and much more.
Incorporates the capabilities of two 2602B's
Experience the same superior measurement integrity, synchronization, speed, and accuracy as the industry-leading Keithley 2602B System SourceMeter, but in a 1U form factor. The 2606B also uses the same analog, digital I/O, and TSP Link connectors as the 2602B, enabling seamless migration.
- Easy to stack and rack
- No additional 1U thermal spacing required
- Get 3 times more channels occupying the same amount of rack space
- Get the same number of channels and occupy 3x less space
Improves channel density by 3 times
When production test rack space comes at a premium and you need to minimize adding new test racks, the 2606B enables you to add more channel capacity in the same rack area compared to traditional 2U form factor SMUs.
- Easy to stack and rack
- No additional 1U thermal spacing required
- Get 3 times more channels occupying the same amount of rack space
- Get the same number of channels and occupy 3x less space
System performance for unmatched production throughput
Test Script Processor (TSP®) technology embeds and executes complete test programs inside the SMU instrument to deliver industry-best performance. TSP-Link® technology enables expansion up to 64 channels for high-speed, SMU-per-pin parallel testing without a mainframe. All channels are simultaneously and independently controlled at a tight
- Eliminates time-consuming bus communications to and from the PC
- TSP script code compatible with Instrument 2602B SourceMeter
- Connect up to 32 TSP-Link nodes or 64 independent SMU channels
- Reconfigure easily as test requirements change
| Model | Channels | Max Current Source/Measure Range | Max Voltage Source/Measure Range | Measurement Resolution (Current / Voltage) | Power |
|---|---|---|---|---|---|
| 2606B | 4 | 3A | 20V | 100fA / 100nV | 20 W |
Laser Diode (VCSEL) Production Test for 3D Sensing Applications
Industry’s best DC test system for Laser Diode (LD) production test uses high speed and high accuracy SMUs for both current sourcing and voltage-current monitoring of laser diode modules, photodiode current. SMUs are the most cost-effective LIV instrumentation with high system synchronization and throughput.
- Programmable current source up to 3 A and 100 μs pulse widths
- Voltage and current measure resolution at 100 nV and 0.1 fA
- Built-in TSP processing capability reduces PC-instrument bus communication
High Volume Production Test of LEDs
The 2606B SMU is an industry leading instrument for LED DC characterization and production test. It’s configurable to source current or voltage coupled with voltage and current measurement at 0.015% basic measure accuracy for a variety of test needs. In addition, the Test Script Processor (TSP®) technology provides throughput advantages.
- Programmable current source up to 3 A and 100 μs pulse widths
- Voltage and current measure resolution at 100 nV and 0.1 fA
- Built-in TSP processing capability reduces PC-instrument bus communication
- Daisy-chain up to 64 channels for high volume parallel test
Transistor Characterization with Multi-Channel SMU Instruments
With its integrated source and measure, voltage or current, precision and accuracy, a 2606B System SourceMeter SMU instrument is ideal for testing transistors on wafer or in packaged parts including capturing drain family of curves, threshold voltage, gate leakage and transconductance.
- Programmable current source up to 3 A and 100 μs pulse widths
- Voltage and current measure resolution at 100 nV and 0.1 fA
- Best accuracy 0.015% with 6½-digit resolution
- Built-in TSP processing capability reduces PC-instrument bus communication
Automated Control from Lab to Fab
Keithley’s Automated Characterization Suite (ACS) offers complete control of your equipment. Whether you need to control a few instruments on your bench, or automate an entire test rack for production, ACS offers a flexible, interactive environment for device characterization, parametric test, reliability test, and simple functional test.
- Perform simple 1-off tests or build complex project trees
- Code with Python inside ACS for unlimited flexibility and control
- Manual or automated wafer prober control
- Data management and statistical analysis capabilities
Related Products
Support at Every Step
We provide support, services, comprehensive training and the resources you need. It’s all part of what we do to maximise the value of your VICOM investment.
Services
Value-add services that complement your VICOM system solution and instrument portfolio to provide a total cost of ownership.
Customer Care
Customer service that provides Return Material Authorisation (RMA) for repair and calibration.
Training
Technical education solutions, product training, and blended learning for technicians who are using new products or working with existing tools
Technical Assistance
Technical Assistance Center to assist you in using/configuring products or address issues regarding product performance
How to get started
Interested in a product demonstration? Contact us for more info, receive a price quote, or find out how to buy.
Contact Sales Expert
Request a Quote
