2601B-PULSE 10 µsec Pulser/SMU
The System SourceMeter® 10 µsec Pulser/Source Measure Unit (SMU) Instrument combines the power of a high current/high speed pulser with measure and the full functionality of a traditional SMU in a single instrument. Its impressive 10 A @ 10 V at 10 μs pulse width and full 1 MS/s digitizing capabilities significantly boost productivity in applications ranging from benchtop characterization through highly automated pulsed I-V production test.
Achieve high pulse fidelity without manual pulse tuning
The 2601B-PULSE’s control loop system eliminates the need to manually tune for load changes up to 3 uH, ensuring your pulse has no overshoot or ringing when outputting pulses from 10 us up to 500 us at any current level up to 10 amps. With pulse rise times < 1.7 us, you can properly characterize your device or circuit under test.
- Pulse 10 A @ 10 V with a 10 us pulse width
- Pulse rise time
Incorporates the functionality of a fast pulser and SMU in one instrument
The 2601B-PULSE adds pulser functionality to the superior measurement, high synchronization, speed, and accuracy you know from the industry-leading Keithley 2601B SMU instrument.
- Pulse 0.05% basic measure accuracy with 1 MS/s digitizing
- SMU 100 nA low current range with 100 fA sensitivity
- Rear panel BNC connections for quick cable setup
Embedded scripting and connectivity for unmatched production throughput
Test Script Processor (TSP®) technology embeds and executes complete test programs inside the SMU instrument to deliver industry-best performance. TSP-Link® technology enables expansion of up to 32 TSP-Link nodes for creating high-speed, SMU-per-pin parallel testing without a mainframe.
- Eliminates time-consuming bus communications to and from the PC
- Advanced data processing and flow control
- Connect up to 32 TSP-Link nodes
- Reconfigure easily as test requirements change
| Model | Channels | Max Current Source/Measure Range | Max Voltage Source/Measure Range | Measurement Resolution (Current / Voltage) | Power |
|---|---|---|---|---|---|
| 2601B-PULSE | 1 | 10 A | 40 V | 100 fA / 100 nV | Pulser: 100 W instantaneous SMU: 200 W instantaneous |
Laser Diode (VCSEL) Production Test for ToF/LIDAR Applications
The ideal solution for laser diode vertical cavity surface emitting laser (VCSEL) LIV production testing, the 2601B-PULSE features a high speed and high accuracy 10 μs Pulser and SMU for both current pulse sourcing and voltage-current monitoring of VCSELs, VCSEL arrays, and laser diode modules. SMUs provide the most cost-effective LIV instrumentation with high system synchronization and throughput.
- Programmable pulse current source up to 10 A and 10 μs pulse widths
- Voltage and current measure resolution at 100 nV and 100 fA
- Built-in TSP® processing capability reduces PC-instrument bus communication
Failure Analysis and Quality Assurance
Semiconductor companies and semiconductor researchers are constantly looking for ways to make devices fail to prevent them in the field. Semiconductor failure analysis (FA) engineers spend countless hours trying to understand why a device failed and how it can be prevented in the future.
- Streamline FA processes with SMU and Pulse testing
- Digital I/O to trigger external IR cameras
- Built-in timer function with 1 μs resolution and ±100 ppm accuracy
Simplified Pulsed/DC I-V Characterization of LEDs
The 2601B-PULSE’s unique current pulsing, DC voltage, and current capabilities enable high speed LED DC and Pulsed I-V characterization and production test with 0.015% basic measure accuracy. Pulse testing a microLED, LED, or high brightness LED (HBLED) minimizes self-heating and reduces the negative impact on measurement accuracy, as well as eliminates the worries about damaging the device under test.
- Programmable current source up to 10 A and 10 μs pulse widths
- Voltage and current measure resolution at 100 nV and 100 fA
- 1 Megasample/second digitizers for fast source and measure data collection
- Built-in TSP processing capability reduces PC-instrument bus communication
On Wafer Semiconductor Testing
Keithley’s 2601B-PULSE and other Series 2600B System SourceMeter® SMU instruments combine the scalability and flexibility of rack-and-stack instruments with the integration and high throughput of mainframe-based systems, using TSP and TSP-Link technologies to reduce manufacturing footprint and cost of test. These instruments are routinely used in on-wafer semiconductor testing of laser diodes, LEDs, transistors, and so much more.
- Built-in TSP processing capability reduces PC-instrument bus communication
- TSP-Link up to 32 instruments at 500 ns synchronization with other Keithley TSP instruments
Keithley KickStart Instrument Control Software No Programming Required.
Making measurements is easy with KickStart. Characterize your devices and materials quickly and easily without programming. Visualize real-time results in graphical and tabular format. Export data tables or graphs for quick reporting or additional analysis in Excel.
- Create single or sweep pulse tests quickly
- Generate linear, log, list, and dual sweeps of voltage and current source with simultaneous measurement
- I-V characterization application to support up to four SMU instruments
- GPIB, USB, Ethernet connectivity on Windows OS
Automated Control from Lab to Fab
Keithley’s Automated Characterization Suite (ACS) offers complete control of your equipment. Whether you need to control a few instruments on your bench, or automate an entire test rack for production, ACS offers a flexible, interactive environment for device characterization, parametric test, reliability test, and simple functional test.
- Perform simple 1-off tests or build complex project trees
- Code with Python inside ACS for unlimited flexibility and control
- Manual or automated wafer prober control
- Data management and statistical analysis capabilities
FREE script developer environment to maximize instrument performance
Test Script Builder (TSB) is a software tool that simplifies building test scripts for Keithley’s Test Script Processor (TSP®)-enabled instruments.
- Send commands and receive responses from the instrument
- Create, manage, and run user scripts
- Debug scripts
- Import factory scripts to view or edit and convert to user scripts
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