Keithley 4200A-SCS Parameter Analyzer

Measure single-digit femtofarads with Keithley's newest capacitance-voltage unit (CVU), the 4215-CVU. By integrating a 1 V AC source into Keithley's industry-leading CVU architecture, the 4215-CVU offers low-noise capacitance measurements at frequencies from 1 kHz to 10 MHz.

• First C-V meter in its class capable of driving a 1 V AC source voltage
• 1 kHz frequency resolution from 1 kHz to 10 MHz
• Measure capacitance, conductance, and admittance
• Measure on up to four channels with the 4200A-CVIV Multiswitch

With the 4201-SMU and 4211-SMU modules, you can achieve stable low current measurements in a high-capacitance system. With four models of source measure unit (SMU) to choose from, the 4200A-SCS can be customized to meet all of your I-V measurement needs. By offering field-installable units and optional preamplifier modules, Keithley ensures that you can make the most accurate low current measurements with little to no downtime.

• Add an SMU without sending the instrument back to the factory
• Make femptoamp measurements
• Up to 9 SMU channels
• Optimized for long cables or large chucks

Keithley Care plans provide fast, high-quality services at a fraction of the cost of on-demand service events. You are one click or phone call away from obtaining repair coverage - no quotes, purchase orders, or approval delays.

Measure sub-femtofarad capacitances with the 4215-CVU module. By driving 1 V AC, the 4215-CVU can achieve a noise level as low as six attofarads when measuring a 1 fF capacitor. This is just one of dozens of applications included with the Clarius software for measuring capacitance and extracting important parameters.

• Built-in femtofarad measurement capability
• 10,000 frequency steps from 1 kHz to 10 MHz
• Customize any test to any device using user libraries

Use Keithley’s custom Very Low Frequency C-V Technique to analyze the capacitance of your high resistance sample. This technique is performed using only source measure unit (SMU) instruments but can be combined with a 4210-CVU to perform higher frequency measurements as well.

• .01 to 10 Hz frequency range with sensitivity of 1 pF to 10 nF
• 3½-digit typical resolution, minimum typical of 10 fF

Keithley's Automated Characterization Suite (ACS) offers complete control of your equipment. Whether you need to control a few instruments on your bench or automate an entire test rack for production, ACS offers a flexible, interactive environment for device characterization, parametric testing, reliability testing, and simple functional testing.

• Perform simple 1-off tests or build complex project trees
• Code with Python inside ACS for unlimited flexibility and control
• Manual or automated wafer prober control
• Data management and statistical analysis capabilities